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Sampling experiments are a leading approach to demonstrating quantum computational advantage, yet their robustness to experimental noise is not completely understood. We develop a common framework for classical simulation of boson and fermion sampling under thermal loss, including pure loss. For Fock-state boson sampling, Gaussian boson sampling with fixed uniform squeezing, and fermion sampling with magic inputs, we obtain polynomial-time sampling at inverse-polynomial total variation error, for any fixed nonzero overall loss rate, and with high probability over Haar-random interferometers. A milder flatness assumption on the ideal output distribution suffices for quasipolynomial-time simulation without Haar randomness. With constant thermal loss per layer, the same flatness assumption gives polynomial-time simulation at logarithmic depth. Our bounds for Fock-state boson sampling cover both dilute and saturated regimes and become stronger near full input filling: when only a bounded number of input modes are empty, the noisy output for Haar-random interferometers converges, as the number of modes grows, to a distribution independent of the interferometer.

When an image classifier decides, we can usually only estimate why. For quantum and all-optical classifiers that act linearly on amplitude-encoded pictures up to the measurement, with no trained classical network before or after them, each class's Born probability above its no-information share, $P_g - b_g$, splits exactly into contributions of the encoded amplitudes, shown as Born evidence maps (BEM). The split itself follows from known results on quadratic forms: with the transmitted light held fixed, it is what Integrated Gradients from a zero baseline and the Shapley value give. What we add is a way to measure it on the hardware that classifies, from class probabilities on a quantum chip or, in simulation, from camera frames on a lens bench, with no gradient circuit and no light sent backwards; a $g\times g$ map takes $1 + 2g^2$ runs. Deleting the 5% of pixels with the highest evidence drops accuracy from 73% to 9% (one seed), as occlusion and gradient $\times$ input do, while plain gradients remove much less. The classifiers share one architecture, a Fourier-plane mask followed by a brickwall circuit on qubits or by phase plates on a lens bench, read by a fixed Born headroom readout with no trained parameter; centring each picture on its own mean lets dark features count as much as bright ones. In simulation, four phase plates at one wavelength reach 72.3% on Caltech-10 colour photographs. On IBM's ibm_kingston, with the mask computed classically before approximate loading, 300 test pictures were classified at 37.7% against 10% chance (56.3% in exact simulation), and $2\times2$ maps of the filtered input of 30 test pictures drawn at random in advance, measured on the chip, agreed with the exact ones ($r = 0.88$; standard estimator 0.82). The maps also revealed a shortcut in the data; as the trim that removed it was chosen on test pictures, the Caltech-10 results are exploratory.