DEQ-Det: Dual Evidence Queries for Few-Shot Analog IC Device Detection
Zidong Zhao, Rong Huang, Chengxing Fan, Jie Hu, Malik Haris, Ghazal A. Fahmy, Morteza Mousazadeh, Guoqiang Zhang
原文摘要
Detecting analog integrated circuit (IC) devices in layout images supports circuit analysis and inspection. With only a few annotated examples, variation in device geometry and visual similarity to dummy or routing structures make reliable detection difficult. Foreground similarity alone can highlight plausible targets without distinguishing them from competing layout patterns. We propose Dual Evidence Queries for Detection (DEQ-Det), which constructs complementary foreground and background references from the same support images without additional annotations. Foreground references capture target morphology, while selected background references characterize surrounding layout patterns. Both sources guide query selection and region verification, combining target appearance with layout context. Across five held-out device categories and three random seeds, DEQ-Det achieves macro AP50 of 39.41 and 53.03 at 10 and 30 shots, exceeding the strongest listed baselines by 3.97 and 9.71 points, respectively. A matched 30-shot ablation further shows that RoI background evidence reduces pooled false positives at comparable recall, supporting its role in interference suppression.
cs.CV