SIExBench: A Benchmark for Automated Repair of Sensitive Information Exposure
Mingming Zhang, Xu Wang, Jian Zhang, Dihao Fan, Xiangxin Meng, Chunming Hu
原文摘要
Modern software systems routinely process credentials, personal records, and other sensitive information. A sensitive information exposure (SIEx) defect makes such information accessible to an unauthorized actor and can cause serious and often irreversible disclosure. However, prior research has focused largely on detecting such exposures rather than repairing the underlying defects, and existing repository-level issue-resolution benchmarks do not specifically target this defect class. We present SIExBench, to our knowledge the first benchmark dedicated to automated repair of SIEx defects. SIExBench contains 161 execution-verified instances from 64 widely used Python and Java repositories, each with an issue report, buggy repository snapshot, developer patch, executable exposure and regression tests, and defect characterization. We evaluate six repair systems with three LLMs, yielding 18 configurations, and systematically analyze their overall effectiveness, performance across defect characteristics, and failure mechanisms. The strongest configuration resolves only 39.1% of the instances, while 40.4% remain unresolved by all 18 configurations. More importantly, 62.1% of unsuccessful attempts produce a valid patch that still leaves sensitive information exposed, making incomplete exposure removal a central challenge. Systems often generate plausible patches and modify relevant code without fully eliminating the exposure, indicating that effective repair must ensure that all relevant paths to sensitive-information exposure are closed. Overall, SIExBench provides a foundation for systematically evaluating and advancing automated repair of sensitive information exposure defects.
cs.SE · cs.CR