← 研踪 PaperTrailarXiv:2609.37314 · v2
FLASH: A "Generate Once, Synthesize Many" Framework for Synthetic Anomaly Generation in Industrial Anomaly Detection
首次提交 2026-09-29 19:50
版本更新 2026-11-05 05:21
雷达观测 2026-11-06 11:06
摘要
Synthetic anomaly generation helps expand industrial anomaly datasets when real defects are scarce or unavailable. Existing approaches lie at two extremes: procedural approaches are fast but struggle to represent complex anomalies, while generative approaches produce diverse defects but require costly per-sample generation. We present FLASH, a framework that decouples defect generation from anomaly synthesis under a ``generate once, synthesize many'' paradigm. Given only normal images, FLASH uses Vision-Language Model (VLM) guidance and an image-generation model to produce a small set of defect images, from which it extracts, validates, and banks reusable defect patches. For synthesis of anomalous images, Object Boundary Suppression (OBS) first identifies the probable foreground object-aware region of the host image, while Multi-Resolution Spectral Pyramid (MRSP) noise generates diverse, size-controllable masks that determine the defect location and spatial extent. It then composes a large and diverse synthetic anomalous image set by localizing the defect region, sampling size-controllable placement masks and seamlessly blending retrieved defects onto new defect-free images without further need for image generation. Experiments on the MVTec AD 2 dataset show that FLASH-generated anomalies nearly close the calibration gap on real defects, reaching 78.1% image-level F1 against an 83.6% real-anomaly upper bound and providing the most consistent calibration transfer across detectors among procedural and generative alternatives. Moreover, FLASH synthesizes anomalies more than 11.95x faster than per-sample generative approaches.
作者备注：Accepted to the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) 2027
观测到的版本
相邻记录可能跳过中间版本；首次发现 v2 及以上也会标为版本更新。
v2 · 2026-11-05 05:21 · 最新观测版本
FLASH: A "Generate Once, Synthesize Many" Framework for Synthetic Anomaly Generation in Industrial Anomaly Detection
Synthetic anomaly generation helps expand industrial anomaly datasets when real defects are scarce or unavailable. Existing approaches lie at two extremes: procedural approaches are fast but struggle to represent complex anomalies, while generative approaches produce diverse defects but require costly per-sample generation. We present FLASH, a framework that decouples defect generation from anomaly synthesis under a ``generate once, synthesize many'' paradigm. Given only normal images, FLASH uses Vision-Language Model (VLM) guidance and an image-generation model to produce a small set of defect images, from which it extracts, validates, and banks reusable defect patches. For synthesis of anomalous images, Object Boundary Suppression (OBS) first identifies the probable foreground object-aware region of the host image, while Multi-Resolution Spectral Pyramid (MRSP) noise generates diverse, size-controllable masks that determine the defect location and spatial extent. It then composes a large and diverse synthetic anomalous image set by localizing the defect region, sampling size-controllable placement masks and seamlessly blending retrieved defects onto new defect-free images without further need for image generation. Experiments on the MVTec AD 2 dataset show that FLASH-generated anomalies nearly close the calibration gap on real defects, reaching 78.1% image-level F1 against an 83.6% real-anomaly upper bound and providing the most consistent calibration transfer across detectors among procedural and generative alternatives. Moreover, FLASH synthesizes anomalies more than 11.95x faster than per-sample generative approaches.
查看此版本解读 →查看此版本原文 ↗