arXiv:2610.36487 · v1

Spatial-Frequency Learning for Scanning Transmission Electron Microscopy Image Enhancement

首次提交 2026-10-27 09:43

版本更新 2026-10-27 09:43

雷达观测 2026-10-29 00:35

摘要

Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution and plays a key role in the discovery and characterization of advanced materials. Raw STEM images are often noisy and blurred due to multiple degradations. Although recent deep learning methods improve STEM images, their performance remains limited under severe degradations. In this work, we propose a spatial-frequency learning framework for STEM image enhancement. Specifically, we design a spatial-frequency fusion network that exploits periodic atomic arrangements in the frequency domain and restores local atomic details in the spatial domain. Spatial- and frequency-domain features are enhanced separately and then fused. We also present a STEM noise calibration method for synthesizing more realistic STEM images. The parameters of scan noise, pointwise noise, and background noise are estimated through statistical analysis and fitting of real STEM images. Using these calibrated parameters, we construct a diverse dataset containing a wider range of atomic arrangements, imaging modes, and degradations. Random masks combine different atomic arrangements to simulate interfaces between multiple materials. Experimental results demonstrate that our method achieves state-of-the-art enhancement performance on synthetic datasets and real images of advanced materials while improving atomic localization accuracy.

作者备注：Accepted by IEEE TPAMI