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arXiv:2611.13452 · v1

SLIC: Reinforcement Fine-Tuning Small LMs for Multi-Turn Analog Circuit Optimization

首次提交 2026-11-10 09:54
版本更新 2026-11-10 09:54
雷达观测 2026-11-11 11:04
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摘要

Analog integrated circuit (IC) design is a multi-turn, simulator-grounded engineering task that demands iterative reasoning over coupled performance tradeoffs, yet proprietary process design kits (PDKs) make hosted large language model workflows difficult to deploy in practical design settings. We present SLIC (Small LM Iterating on Circuits), a reinforcement fine-tuning framework that trains a 4B-scale, locally deployable language model for closed-loop analog circuit optimization. SLIC pairs structured circuit representations with discretized relative-update actions, domain- and success-gated multiobjective rewards, and Reward-Guided Rollout Steering (RGRS), which turns per-step simulator feedback into signals for both policy learning and online rollout construction in this sparse, highly constrained domain. We further release an open, goal-conditioned benchmark of 41 amplifier topologies with standardized protocols for in-distribution validation, held-out topology evaluation, and cross-technology-node transfer. Trained solely with open source 65 nm CMOS predictive technology models (PTM), SLIC-Random achieves 87.1% in-distribution four-specification Pass@1 within eight turns, surpassing the 763B DeepSeek-V4.1-Flash Think by 48.5 percentage points. Beyond the training distribution, SLIC-Softmax reaches 72.6% Pass@1 on held-out topologies, and the trained policies consistently transfer across five unseen technology nodes without additional fine-tuning. This transfer extends to a commercial TSMC 65 nm CMOS PDK, where SLIC-Random achieves 49.9% held-out-topology Pass@1, demonstrating practical deployment through local inference without transmitting proprietary data to external LLM services. Performance further scales with test-time simulator interactions, reaching up to 83.2% held-out-topology Pass@1 at a 32-turn budget.

作者备注:Accepted at NeurIPS 2026. 43 pages, 12 figures. Project page: https://hangroup.mit.edu/slic/

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v1 · 2026-11-10 09:54 · 最新观测版本

SLIC: Reinforcement Fine-Tuning Small LMs for Multi-Turn Analog Circuit Optimization

Analog integrated circuit (IC) design is a multi-turn, simulator-grounded engineering task that demands iterative reasoning over coupled performance tradeoffs, yet proprietary process design kits (PDKs) make hosted large language model workflows difficult to deploy in practical design settings. We present SLIC (Small LM Iterating on Circuits), a reinforcement fine-tuning framework that trains a 4B-scale, locally deployable language model for closed-loop analog circuit optimization. SLIC pairs structured circuit representations with discretized relative-update actions, domain- and success-gated multiobjective rewards, and Reward-Guided Rollout Steering (RGRS), which turns per-step simulator feedback into signals for both policy learning and online rollout construction in this sparse, highly constrained domain. We further release an open, goal-conditioned benchmark of 41 amplifier topologies with standardized protocols for in-distribution validation, held-out topology evaluation, and cross-technology-node transfer. Trained solely with open source 65 nm CMOS predictive technology models (PTM), SLIC-Random achieves 87.1% in-distribution four-specification Pass@1 within eight turns, surpassing the 763B DeepSeek-V4.1-Flash Think by 48.5 percentage points. Beyond the training distribution, SLIC-Softmax reaches 72.6% Pass@1 on held-out topologies, and the trained policies consistently transfer across five unseen technology nodes without additional fine-tuning. This transfer extends to a commercial TSMC 65 nm CMOS PDK, where SLIC-Random achieves 49.9% held-out-topology Pass@1, demonstrating practical deployment through local inference without transmitting proprietary data to external LLM services. Performance further scales with test-time simulator interactions, reaching up to 83.2% held-out-topology Pass@1 at a 32-turn budget.

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