← 研踪 PaperTrailarXiv:2611.15958 · v1
DUFT: Device-Unique Feedback Traversal for Entropy-Estimated Response Extraction and Mutual Authentication using SRAM PUFs
首次提交 2026-11-12 03:52
版本更新 2026-11-12 03:52
雷达观测 2026-11-13 14:16
摘要
Static Random Access Memory (SRAM) Physical Unclonable Functions (PUFs) are a promising technology in the realm of random number generation for key generation, but for PUF-based authentication, they have been sidelined due to their limited challenge space as a reservoir of Challenge-Response Pairs (CRPs). In this paper, we develop a seed-based, round-iterated feedback mechanism, which we name Device-Unique Feedback Traversal (DUFT). The feedback chain is driven by the device's unstable and stable bit positions in its stability mask against the address to create a unique traversal. Additionally, a device-key hashed from the unique SRAM-PUF array is also included in calculating the next round of the chain to keep it secret. By estimating the physical SRAM source's entropy and error rate empirically, or by having a source with established metrics in both, DUFT estimates the number of rounds of feedback in the traversal to be performed to achieve a certain amount of min-entropy. We reach 128 bits of estimated min-entropy on our reference hardware under stated assumptions and experimental estimates. The number of rounds in the traversal scales directly with measured source-entropy, allowing security to be increased for weaker sources at the cost of running time. Using this feedback-traversal wrapper over SRAM-PUFs to obtain a measured-response, we propose an extremely lightweight authentication and key-encapsulation protocol for resource-constrained embedded devices. We realize and evaluate DUFT end-to-end on physical IoT/embedded hardware: a discrete-SRAM node pair running the complete mechanism and end-to-end protocol, and an embedded-SRAM microcontroller for the mechanism alone.
作者备注：29 pages, 8 figures, 5 tables
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v1 · 2026-11-12 03:52 · 最新观测版本
DUFT: Device-Unique Feedback Traversal for Entropy-Estimated Response Extraction and Mutual Authentication using SRAM PUFs
Static Random Access Memory (SRAM) Physical Unclonable Functions (PUFs) are a promising technology in the realm of random number generation for key generation, but for PUF-based authentication, they have been sidelined due to their limited challenge space as a reservoir of Challenge-Response Pairs (CRPs). In this paper, we develop a seed-based, round-iterated feedback mechanism, which we name Device-Unique Feedback Traversal (DUFT). The feedback chain is driven by the device's unstable and stable bit positions in its stability mask against the address to create a unique traversal. Additionally, a device-key hashed from the unique SRAM-PUF array is also included in calculating the next round of the chain to keep it secret. By estimating the physical SRAM source's entropy and error rate empirically, or by having a source with established metrics in both, DUFT estimates the number of rounds of feedback in the traversal to be performed to achieve a certain amount of min-entropy. We reach 128 bits of estimated min-entropy on our reference hardware under stated assumptions and experimental estimates. The number of rounds in the traversal scales directly with measured source-entropy, allowing security to be increased for weaker sources at the cost of running time. Using this feedback-traversal wrapper over SRAM-PUFs to obtain a measured-response, we propose an extremely lightweight authentication and key-encapsulation protocol for resource-constrained embedded devices. We realize and evaluate DUFT end-to-end on physical IoT/embedded hardware: a discrete-SRAM node pair running the complete mechanism and end-to-end protocol, and an embedded-SRAM microcontroller for the mechanism alone.
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