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新论文 · v1arXiv:2611.16772

Class-Competence Aggregation: Output-Layer Routing for Federated Multiclass DDoS Detection under Class-Concentrated Non-IID Data

Tapu Datta, Hafiz Imtiaz

原文摘要

Federated learning over distributed intrusion-detection sensors naturally produces \emph{class-concentrated} non-IID data, where an entire attack class is held by a single client and absent elsewhere. We show this collapses federated averaging in a specific, localized way: the output layer holds one decision boundary per class, and when a class's aggregation weight comes overwhelmingly from clients that have never seen it, its neuron receives an active anti-signal rather than mere dilution, collapsing to zero. On CIC-DDoS2019, standard FedAvg drives the concentrated LDAP class to $0.00 \pm 0.00\%$ F1 across every seed. We propose Class-Competence Aggregation (CCA), which aggregates the output layer per class using each client's own locally reported validation F1 as the weight, while hidden layers remain under standard size-weighted FedAvg. CCA requires no server-held auxiliary data and adds only one F1 scalar per class per round beyond the feature-scaling and class-count exchanges common to any federated pipeline. On our primary CNN-LSTM architecture, CCA alone raises LDAP F1 from $0\%$ to $84.83 \pm 1.65\%$, and the full method reaches $91.64 \pm 0.57\%$ macro F1, closing the federated-to-centralized gap from $-42.53$ to $-4.05$ points. Benchmarked against four other federated methods under identical partitions and seeds, CCA is the only one that recovers the concentrated class substantially and reliably; a $178\times$ smaller MLP shows the same qualitative recovery, though less completely, confirming the effect holds across architecture scale even as its magnitude varies. Results are validated across three seeds and replicated on a second dataset, CICIDS2017.

cs.LG · stat.ML

新论文 · v1arXiv:2611.16750

Interpretable machine learning diagnosis of degradation mechanisms in lead-free $RbSn_{0.5}Ge_{0.5}I_{3}$ solar cells from temperature- and illumination-dependent electrical measurements

Nabanita Sarker, Hafiz Imtiaz

原文摘要

Machine learning coupled with device simulation is widely used to optimize thin-film solar cells, but almost exclusively in the forward direction, from device parameters to predicted performance. The inverse problem encountered after fabrication, namely identifying the mechanism that limits a given device, is still addressed by manual inspection of characterization data. In this work, both directions are examined for lead-free $RbSn_{0.5}Ge_{0.5}I_{3}$ solar cells using approximately 42,000 SCAPS-1D simulations. Replacing the Spiro-OMeTAD hole transport layer with CuI increases the simulated power conversion efficiency from 19.6\% to 21.6\%, almost entirely through the fill factor. Surrogate models trained and tested on a factorial parameter grid substantially overstate their predictive accuracy. An XGBoost regressor attains $R^2 = 0.9997$ on held-out grid points but only 0.58 on independently sampled devices, whereas training on a Latin hypercube design of comparable size restores $R^2 = 0.995$. For the inverse problem, a multi-label classifier identifies which of six degradation mechanisms are present from simulated temperature- and illumination-dependent open-circuit-voltage measurements. It achieves a macro $F_1$ score of 0.938, compared to 0.687 for a calibrated physics-rule baseline. The classifier does not, however, generalize to combinations of mechanisms absent from the training set.

cs.LG · math-ph