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首次观测 · 记录 #1CVF · CVPR 2026:cvf:aba2ddb178a6ef311eaa9223c089112dCVF · CVPR 2026

Revisiting Pose Sensitivity in Splat-based Computed Tomography under Sparse-view Reconstruction

Choi, Kiseok, Cho, Hyeongjun, Kim, Inchul, Kim, Min H.

原文摘要

X-ray computed tomography (CT) reconstructs volumetric representations of objects from projection images obtained by transmitting X-rays through a target. Recent splat-based tomography, which represents a volume as a continuous distribution of 3D Gaussians, has demonstrated both high reconstruction quality and fast convergence in cone-beam sparse-view CT. However, when deployed in real CT systems with limited and non-uniform view distributions, we observe distinctive streak and strip artifacts that are far more pronounced than in conventional reconstruction methods. Through detailed analysis, we show that these artifacts primarily originate from pose inaccuracies in the acquisition geometry rather than from view sparsity itself. We revisit pose sensitivity in the splatting formulation and derive a stable gradient-based framework that jointly refines geometric parameters during reconstruction. Our study not only identifies how pose perturbations propagate through the differentiable projection operator but also reveals why splat-based CT is particularly vulnerable to geometric misalignment. The resulting formulation remains lightweight and easily integrable into existing pipelines while substantially improving reconstruction fidelity under real-world sparse-view conditions.

cs.CV

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition · 2026 · 正式发表

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CVF · CVPR 2026 ↗PDF ↗
首次观测 · 记录 #1CVF · CVPR 2026:cvf:da6a2023e30495eefefea5cae80a3eeeCVF · CVPR 2026

Dense Metric Depth Completion from Sparse Direct Time-of-Flight Sensors

Kim, Hakyeong, Wang, Ruicheng, Yao, Chengtang, Yang, Jiaolong, Kim, Min H.

原文摘要

Direct Time-of-Flight (dToF) sensors provide highly accurate metric depth and are more robust than indirect ToF systems in challenging real-world conditions. However, their high manufacturing cost and limited photodiode array size produce depth maps that are extremely sparse, low-resolution, and noisy, making them unsuitable for VR/XR, robotics, and 3D perception tasks that require dense metric depth. Existing monocular and depth completion methods struggle to handle the unique sampling patterns and hardware artifacts of dToF devices, and their performance often deteriorates significantly under severe sparsity or noise. We present a generalizable framework for dense metric depth completion from sparse dToF measurements, capable of operating across diverse sensor types, sparsity levels, and noise conditions. Our model employs a depth-guided dual-branch Vision Transformer encoder that processes RGB images and sparse dToF measurements separately, while a masked joint attention module allows depth tokens to reliably guide image features without being overwritten by them. A lightweight decoder reconstructs dense metric depth efficiently, without diffusion-based or refinement-heavy post-processing. To address the scarcity of paired training data, we introduce a comprehensive dToF simulation pipeline that reproduces the characteristics of flash, sub-VGA flash, and rotating sensors, including hardware-induced degradation, irregular sparsity, and realistic noise distributions. Trained entirely on synthetic data, our model achieves strong zero-shot generalization across 6 datasets and 3 real dToF devices, outperforming state-of-the-art approaches in both accuracy and computational efficiency. This establishes a robust and practical solution for dense metric depth completion from sparse direct ToF sensors.

cs.CV

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition · 2026 · 正式发表

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CVF · CVPR 2026 ↗PDF ↗
首次观测 · 记录 #1CVF · CVPR 2026:cvf:e0af5ac100b2955999e3b1b095599890CVF · CVPR 2026

Splat-Based Metal Artifact Reduction in Cone-Beam CT via Compact Attenuation Modeling

Choi, Kiseok, Cho, Jaemin, Kim, Inchul, Kim, Min H.

原文摘要

X-ray computed tomography (CT) suffers from severe metal artifacts when high-attenuation objects such as dental fillings or orthopedic implants are present. These artifacts originate from the polychromatic nature of X-rays, where attenuation varies strongly with photon energy and material composition, breaking the monochromatic assumption used by conventional reconstruction algorithms. Recent neural rendering approaches attempt to address this mismatch through differentiable polychromatic projection models, but they still struggle with smoothness bias, loss of fine structures, and prohibitive computation when extended to large-scale cone-beam CT. We introduce a splat-based metal artifact reduction framework that incorporates a physically grounded polychromatic forward model into a continuous Gaussian representation for cone-beam CT. Each Gaussian encodes the energy-dependent attenuation of the underlying material using a compact material parameterization, which enables efficient joint optimization of geometric and material properties without relying on a metal mask. This compact attenuation formulation captures the essential variation across biological tissues and metallic implants, allowing our model to explain metal-induced nonlinearity while preserving high-frequency structure. Experiments on simulated and real cone-beam CT scans show that our method converges significantly faster and suppresses metal artifacts more effectively than existing reconstruction and neural field-based approaches.

cs.CV

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition · 2026 · 正式发表

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CVF · CVPR 2026 ↗PDF ↗