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arXiv 最近完成扫描:2026-11-15 10:52 · 全站最近入库:2026-11-14 15:09各信源进度 →

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版本更新 · v2arXiv:2604.13577

Lower Bounds for Testing Directed Acyclicity in the Unidirectional Bounded-Degree Model

Yuichi Yoshida

原文摘要

We study property testing of directed acyclicity in the unidirectional bounded-degree oracle model, where a query to a vertex reveals its outgoing neighbors. We prove that there exist absolute constants $d_0\in\mathbb{N}$ and $\varepsilon>0$ such that for every constant $d\ge d_0$, any one-sided $\varepsilon$-tester for acyclicity on $n$-vertex digraphs of maximum outdegree at most $d$ requires $\widetildeΩ(n^{2/3})$ queries. This improves the previous $\widetildeΩ(n^{5/9})$ lower bound for one-sided testing of acyclicity in the same model. We also prove that, under the same degree assumption, any two-sided $\varepsilon$-tester requires $Ω(\sqrt n)$ queries, improving the previous $Ω(n^{1/3})$ lower bound. We further prove an $Ω(n)$ lower bound for tolerant testing for some absolute constant outdegree bound $d$ by reduction from bounded-degree $3$-colorability.

cs.DS

新论文 · v1arXiv:2611.16176

A One-Sided Sublinear-Query Tester for Bounded-Degree 2SAT

Yuichi Yoshida

原文摘要

We give a one-sided tester for satisfiability of 2CNF formulas in the bounded-degree model. For every degree bound $Δ$, distance parameter $\varepsilon>0$, and $ν\in(0,1/2)$, its query complexity on $n$-variable formulas is $\widetilde O_{\varepsilon,Δ,ν}(n^{1/2+ν})$.

cs.DS

版本更新 · v2arXiv:2604.02582

Sensitivity and Locality Lower Bounds via Low-Soundness Label Cover

Noah Fleming, Max Hopkins, Yuichi Yoshida

原文摘要

We study the sensitivity of approximation algorithms, which measures how much their output distributions change under a single input edit. We show that, for Set Cover, Dominating Set, Min-Rep, and minimum unweighted directed 3-spanner, even a $\log^βn$ approximation requires sensitivity $n^{Ω(1)}$, for some absolute constant $β>0$ and all sufficiently large $n$. The lower bounds hold even for randomized algorithms with unrestricted computation. Here $n$ is the universe size for Set Cover and the number of vertices for the graph problems. On bounded-degree graphs, our sensitivity lower bounds imply logarithmic locality lower bounds in the randomized LOCAL model and its non-signaling generalization. For Dominating Set, fix $\varepsilon\in(0,1)$ and a sufficiently large constant maximum-degree bound $Δ$. A $(1+\varepsilon)\lnΔ$ approximation can be achieved with sensitivity and LOCAL round complexity independent of $n$. We show that improving the ratio to $(1-\varepsilon)\lnΔ$ requires sensitivity $n^{Ω_{\varepsilon,Δ}(1)}$, and hence locality $Ω_{\varepsilon,Δ}(\log n)$. For minimum unweighted directed 3-spanner, every constant approximation factor requires logarithmic locality, even on DAGs of constant maximum total degree. The key ingredient is a polynomial sensitivity lower bound for a variant of low-soundness Label Cover. Fleming and Yoshida established such a lower bound when the required fraction of satisfied constraints on satisfiable instances is close to one. We extend this to inverse-polylogarithmic fractions, enabling the reductions to the problems above. We adapt the Impagliazzo--Kabanets--Wigderson direct-product construction and Dinur--Harsha iterated composition to control the propagation of input edits, and design recovery procedures that are stable under changes to both the supplied labeling and the source instance.

cs.DS

新论文 · v1arXiv:2611.02374

Submodularity Is Barely Testable

Diptaksho Palit, Yuichi Yoshida

原文摘要

In 2010, Seshadhri and Vondrák asked: is submodularity testable? For functions $f : \{ 0, 1 \}^n \to \mathbb{R}$, they gave a tester that makes $2^{O(\sqrt{n} \log n)}$ queries. We show that every tester, even an adaptive one with two-sided error, must make $2^{Ω(\sqrt{n})}$ queries, thereby concluding: submodularity is barely testable.

cs.DS

新论文 · v1arXiv:2610.36630

Uniformity Testing for the Monomer-Dimer Model

Joy Qiping Yang, Yuichi Yoshida

原文摘要

We study uniformity testing for the monomer-dimer model on a known graph $G=(V,E)$. Given samples from an unknown distribution $D_w(M)\propto \prod_{e\in M} w_e$ over matchings $M$ of $G$, we ask whether $D_w$ is the uniform distribution over all matchings of $G$ or is $\varepsilon$-far from it in total variation distance. Our main result is that, for every maximum-degree bound $Δ$, uniformity can be tested with $\widetilde O_Δ(\sqrt m/\varepsilon^2)$ samples, where $m=|E|$. We complement this with an information-theoretic lower bound for general graphs: for every pair of parameters $n\le m\le n^2$, there are graphs with $Θ(n)$ vertices and $Θ(m)$ edges on which every tester requires $Ω(\sqrt m/\varepsilon^2)$ samples. Thus, for bounded-degree graph families with $m=Θ(n)$, testing uniformity over the space of matchings has $\widetilde Θ(\sqrt n/\varepsilon^2)$ sample complexity, in contrast with the $Θ(n/\varepsilon^2)$ samples needed to estimate $D_w$ in total variation distance.

cs.DS · cs.DM